The F-20E is a micro climate, SSD Test System made for reliability and qualification testing. The F-20E is a mobile chamber that will start and manage device tests, synchronize temperature/humidity, organize test history and results and provide direct device access for deep analysis and trouble shooting.
- Tailored to SSD testing with SAS/SATA interfaces
- Programmable power margining per DUT with current and voltage measurement read-back
- Turnkey solution, featuring Neosem's Andromeda operating software
- User-friendly GUI allows for easy test control (start/stop) and monitoring (status) of all Device Under Test (DUT) on one touch screen
- Provides characterization data such as performance, measurement, throughput, IOPs, thermal and power consumption
- GUI allows intuitive drill down monitoring from scripts level through DUT interface commands and down to bit level write and read operations
- Comprehensive library of engineering, reliability, quality and production test scripts designed for SSD devices