Neosem’s P25 Script Language Provides:

  • • Remote Monitoring
  • • Java Libraries and Javadoc
  • • Test Script Editor
  • • Variables Manipulation
  • • Read, Write, Seek Macros
  • • Vendor Unique Commands
  • • LABEL and GOTO
  • • LOOP and Timed Loop
  • • Buffer Data and Conditionals
  • • Script Chaining
  • • Performance Measurement
  • • Voltage Margin
  • • Power Profile
  • • High Performance Data Verification
  • • Oven Control
  • • Trace
Testing Solutions

The F-60E environmental system delivers accurate testing with consistency over a wide range of temperature and humidity. This test system will start and manage the device tests, synchronize the temperature/humidity with the testing, gather and organize test history and test results, and provide direct device access for deep analysis and troubleshooting. The environmental chamber provides four-corner testing on parameters such as temperature (hot and cold), humidity, and voltage.

  • Tailored to HDD, SSD or PCIe Testing with SAS, SATA, AHCI, NVMe and Serial interfaces
  • Programmable power margining per DUT with current and voltage measurement read-back
  • Turnkey solution, featuring Neosem's Andromeda operating software
  • User-friendly GUI allows for easy test control (start/stop) and monitoring (status) of all Device Under Test (DUT) on one screen
  • Provides characterization data such as performance, measurement, throughput, IOPs, thermal and power consumption
  • GUI allows intuitive drill down monitoring from scripts level through DUT interface commands and down to bit level write and operations
  • Comprehensive library of engineering, reliability, quality and production test scripts designed for HDD, SSD and PCIe devices