Neosem’s P25 Script Language Provides:

  • • Remote Monitoring
  • • Java Libraries and Javadoc
  • • Test Script Editor
  • • Variables Manipulation
  • • Read, Write, Seek Macros
  • • Vendor Unique Commands
  • • LABEL and GOTO
  • • LOOP and Timed Loop
  • • Buffer Data and Conditionals
  • • Script Chaining
  • • Performance Measurement
  • • Voltage Margin
  • • Power Profile
  • • High Performance Data Verification
  • • Oven Control
  • • Trace

Testing as a Service (TaaS) is of particular interest to customers who are developing new products or those with lower volume production levels that will not support the required capital to purchase dedicated testing systems. Our third-party test results allow you to sell your products with proven quality and reliability.

Based on your specific requirements, Neosem tests your SSD, HDD, ODD or PCIe devices using our state of the art testing systems. We have an expansive portfolio of storage drive systems that test the performance of drive memory and electronics under different conditions. Upon the completion of testing, we deliver detailed reports with the ability to customize report criteria based on the information that’s required.

Neosem uses its own testers considered to be the gold standard in the industry, for OEM Reliability Demonstration Tests (RDT), R&D to support product development, and quality assurance for Ongoing Reliability Testing (ORT) to determine if product performance is gradually drifting away from the original specifications. Our objective third party qualification testing builds confidence in your devices.

More than just hardware Neosem’s Andromeda software is a major differentiator. We have a repository of testing scripts and programs that have been developed and implemented for over 30 years. Our structured software architecture allows it to easily configure to each system and be optimized to deliver preferred test routines.

Our testing systems can be segmented into:

  • Bench-top stations that test electronic performance in ambient environments.
  • Burn-in racks that test performance and durability in high temperature conditions
  • Environmental chambers that subject drives to heat, cold and varying levels of humidity
  • Self-test chambers that run test routines from inside the device itself
Bench-Top-Tester Burn-in-rack Enviromental Chamber Self Test
Ambient Heat Heat Heat
Electronic Performance Electronic Performance Cold Cold
Humidity Humidity
Electronic Performance Electronic Performance

For those interested in conducting their own testing requirements, we rent access to our testing facilities. Our facility features products ranging in size from bench-top (desktop) stations that can test one drive at a time to multiple larger units that can test 500+ drives (per module) at a time. We can accommodate an almost limitless capacity.

Let us help you determine your specific requirements and provide you with the results, analysis and information you need to improve your devices. Contact us for more information.