Neosem’s P25 Script Language Provides:

  • • Remote Monitoring
  • • Java Libraries and Javadoc
  • • Test Script Editor
  • • Variables Manipulation
  • • Read, Write, Seek Macros
  • • Vendor Unique Commands
  • • LABEL and GOTO
  • • LOOP and Timed Loop
  • • Buffer Data and Conditionals
  • • Script Chaining
  • • Performance Measurement
  • • Voltage Margin
  • • Power Profile
  • • High Performance Data Verification
  • • Oven Control
  • • Trace
 

Applications

 

Proven Testing Solutions

Neosem ’s storage device testing solutions have enabled our SSD, HDD and PCIe Manufacturing and OEM customers to arm their products with proven quality and reliability. Where the highest accuracy and consistency in testing is a dominant concern, our solutions are much sought after. More than just hardware, our software includes a highly evolved, comprehensive library of test scripts that can be customized and tailored to individual requirements. At Neosem, we are committed to providing value-driven and reliable test systems and solutions for storage device testing.

When you invest in a Neosem testing systems you get access to industry-standard tests based on parameters such as endurance, component failures, and data retention. As a manufacturer or OEM, you can use this comprehensive test result data to enhance the performance and viability of your storage devices throughout the manufacturing process.

Our highly evolved, comprehensive library of test scripts enable full and unparalleled testing throughout the manufacturing development process.

Engineering Verification Testing (EVT): ensures that devices perform to set goals and specificationsDesign Verification Testing (DVT): delivers objective testing to verify product specifications, interface standards and OEM requirements

Reliability Demonstration Testing (RDT):performed at the system level, these tests determine whether devices will attain a specified life, based on the calculated Mean Time Between Failures (MTBF)

Qualification Testing: provides SSD, HDD and PCIe manufacturers and OEMs with third-party proven, quality and reliability

JEDEC Certification: based on JEDEC requirements for Client and Enterprise application class SSD endurance ratings the following conditions need to be satisfied:

• maintain capacity

• maintain required Uncorrectable Bit Error Rate for its application class

• meet required Functional Failure Rate for its application class

• maintain data with unplanned power off for time required per its application class

SNIA Certification: based on a device’s performance with emphasis on a devices:

• prior usage

• pretest state

• testing parameters

Ongoing Reliability Testing (ORT): ensures that the quality of SSDs are of the same specifications as the day they first went into production

Return Material Authorization (RMA): tests devices that are returned by OEMs to discover reasons for failure

storage device testing